NEW SCHAFFNER ENGINEERING GUIDE PROVIDES A COMPREHENSIVE,HANDY REFERENCE FOR TRANSIENT IMMUNITY TESTING

Edison, NJ, May 2002– A new comprehensive 38-page engineering guide on transient immunity testing is now available from Schaffner EMC. The handy reference guide describes the mechanisms involved in generating each type of transient, the standard tests that have been developed to deal with them, and some of the practical issues that arise while performing these tests to help ensure product immunity from several sources of transient phenomena that are present in the electromagnetic environment.

Topics covered in the guide include electrostatic discharge (ESD), electrical fast transient bursts (EFT), and surge. Each type of transient is discussed in detail, describing mechanisms, sources and causes of the transient, the effect the transient has on electronics, the necessary equipment needed to perform immunity testing, and practical test layout, procedures and tips.

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Reference materials such as generic and product standard requirements, equations for ESD, EFT and surge voltage waveforms, and a definition of surge and transient energy are also included in the engineering guide.

For copies of the Transient Handy Guide, or to request more information, please contact Mary Jane Salvador, Schaffner EMC, Inc., 52 Mayfield Avenue, Edison, NJ 08837.
Tel: (732) 225-9533 ext.239; Fax: (732) 225-4789; E-mail: usasales@schaffner.com.
Web: www.schaffner.com.

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READER SERVICE INQUIRIES: Please forward all reader service inquiries to Mary Jane Salvador, Schaffner EMC, Inc., 52 Mayfield Avenue, Edison, NJ 08837.

EDITOR'S NOTE: Schaffner EMC, Inc., provides the world's largest range of EMI components, EMC instrumentation and test systems for radiated and conducted interference, and advanced power supply test systems.





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